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Seminar list (2019)Seminar

JAIMA Seminar

March 20(Wed.)
6-12
11:20
|
11:30
New Application and Encountering Subjects for Instrumental Analytical
A member of Technial,Affairs' Committee,
Japan Analytical Instruments Manufacturers' Association

【Venue : Special Seminar Room 6, East Hall 6】
 
Closed

6-13
11:30
|
12:10
Ms. Takako Suematsu
【Language: Japanese】
Prospect of purity determination for chemical compounds using NMR:
JIS K 0138
Dr. Takako Suematsu,
JEOL RESONANCE Inc.

【Venue : Special Seminar Room 6, East Hall 6】

Application of NMR is widely used as a method for purity determination of organic compounds because of its accuracy and high reliability. The method (quantitative NMR , qNMR) was published as Japanese Industrial Standard (JIS) K0138 last year, and standard analysis operation can be referred. In the lecture, the fundamental understanding of qNMR the contribution to the field of analytical chemistry and the prospect of qNMR will be explained.
Closed

6-14
12:25
|
13:05
Mr. Kazuya Nakamura
Mr. Satoshi Kaneoka
【Language: Japanese】
IntroducingTablet analysis solution by Agilent Molecular Spectroscopy  (transmission Raman spectroscopy and Laser Direct Infrared Imaging (LDIR) Chemical Imaging)
Mr. Satoshi Kaneoka,
Agilent Technologies Japan, Ltd.

Mr. Kazuya Nakamura,
Japan Machinery Company

【Venue : Special Seminar Room 6, East Hall 6】

The TRS100 enables fast, easy to use whole tablet or capsule assay & polymorph analysis. Easier to implement than other spectroscopic methods, Agilent's transmission Raman spectroscopy (TRS) technology allows simple method-development and deployment in QC applications.  The Agilent 8700 LDIR Chemical Imaging System provides a simple, intuitive and automated approach to obtain reliable high definition chemical images of constituents present on a flat surface.
Closed

6-15
14:05
|
14:45
Mr. Toshifumi Uchiyama
【Language: Japanese】
Applications of research for physical and chemical properties using UV-Vis
spectroscopy
Mr. Toshifumi Uchiyama,
Applicative Solution Lab Division,
JASCO Corporation

【Venue : Special Seminar Room 6, East Hall 6】

UV-Vis spectrometer is used for measurement of absorbance in quantitative analysis. However, UV-Vis spectroscopy is also used for evaluation of physical properties of materials due to innovation of attachments and various software. Herein, we will introduce our integrating sphere and absolute reflectance measurement unit and their measurement principles. For example, it is film thickness evaluation, structural color evaluation, turbidity, and so on.
Closed

6-16
15:00
|
15:40
Mr. Hiroyuki Honma
Mr. Takahiro Nakagawa
【Language: Japanese】
On the Importance of Environment Improvement and Operation to Protect Analysis Data
Mr. Hiroyuki Honma,
Yamato Scientific Co., Ltd.

Mr. Takahiro Nakagawa,
Lifematics Inc.

【Venue : Special Seminar Room 6, East Hall 6】

In recent years, the importance of storing measurement results to a server has increased. However, unlike analytical instruments, servers have a product life cycle that is fast and also requires the development of an appropriate environment and professional operation for managing valuable data. In this lecture, we will include identifying and solving the problems for protecting the data of measurement results.
Closed

6-17
15:55
|
16:35
Mr. Takuma Ampo
【Language: Japanese】
Applications of Microanalysis X-ray fluorescence apparatus in Material development 
Mr. Takuma Ampo,
Analytical Laboratory TOKYO,
Analytical Technology Center,
HORIBA TECHNO SERVICE CO., LTD.

【Venue : Special Seminar Room 6, East Hall 6】

Analysis of microscopic areas is required due to advanced functions of materials, miniaturization of electronic and electric parts, development of nanotechnology, and the like. Fluorescent X-ray Analyzer enables qualitative and quantitative determination of elements consisting of sample, and observation of crystal structure of sample nondestructively. In this presentation, we introduce several applications mainly related to X-ray Fluorescence Analytical Microscope “XGT-9000” designed to permit the X-ray beam area down to the minimum diameter 10 μm.
Closed

 

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